Contact Reticles are used to provide measurement capabilities to a number of different magnifiers by adding fixed measurement guides that are visible against an examined subject. Contact Reticles are attached to a magnifier's lens, adding a fixed measurement tool to the magnifier. Contact Reticles are available in a number of different formats designed for various kinds of measurement including crosshair, linear, circular, or multi scale.
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[東京オフィス] 〒113-0021 東京都文京区本駒込2-29-24 パシフィックスクエア千石 4F
[秋田工場] 〒012-0801 秋田県湯沢市岩崎字壇ノ上3番地